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Shielding Effect of (RE)Ba2Cu3O7-d-Coated Conductors on Eddy Current Loss of Adjacent Metal Layers under AC Magnetic Fields with Various Orientations

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(RE)Ba2Cu3O7-d (REBCO) coated conductors are becoming a preferred wire choice for many potential high temperature superconducting (HTS) applications, where additional metal layers are usually attached to the REBCO conductors to improve reliability and stability. In such cases, the eddy current loss in the metal layers is affected by the magnetic field shielding by adjacent REBCO coated conductors. Here we present the ac loss measurement and simulation results in three copper-superconductor stacks comprising a 10-mm-wide Fujikura-coated conductor with one, two, and four 0.1-mm-thick, 10-mm-wide copper strips, under various applied magnetic field angles (defined by the angle between the applied magnetic field and the wide face of the superconductor) from 15° to 90° at 77 K. The amplitude of the magnetic field is up to 100 mT. The shielding effect, which reduces the eddy current loss in the metal layers stacked with a superconductor layer, increases with decreasing field angles, due to the change of the effective penetration field at the different field angles. The eddy current loss in the copper strips in the copper-superconductor stacks under the magnetic fields with various orientations is dominated by the perpendicular magnetic field component.

History

Preferred citation

Sun, Y., Long, N. J., Sidorov, G., Fang, J., Badcock, R. A. & Jiang, Z. (2021). Shielding Effect of (RE)Ba2Cu3O7-d-Coated Conductors on Eddy Current Loss of Adjacent Metal Layers under AC Magnetic Fields with Various Orientations. IEEE Transactions on Applied Superconductivity, 31(1), 1-8. https://doi.org/10.1109/TASC.2020.3011390

Journal title

IEEE Transactions on Applied Superconductivity

Volume

31

Issue

1

Publication date

2021-01-01

Pagination

1-8

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication status

Published

Online publication date

2020-07-27

ISSN

1051-8223

eISSN

1558-2515