Jiang 2018 Dynamic resistance measurement of a four-tape YBCO.pdf (596.63 kB)
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Dynamic Resistance Measurement of a Four-Tape YBCO Stack in a Perpendicular Magnetic Field

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posted on 30.03.2021, 02:51 by Zhenan JiangZhenan Jiang, W Zhou, Christopher BumbyChristopher Bumby, M Staines, Q Li, Rodney BadcockRodney Badcock, Nicholas LongNicholas Long, J Fang
Dynamic resistance occurs when HTS (high-temperature superconductor) coated conductors carry dc current under ac magnetic field. This dissipative effect can play a critical role in many HTS applications. Here, we report on dynamic resistance measurements of a four-tape YBCO stack comprising 4-mm-wide coated conductors, which experience an applied ac perpendicular magnetic field with an amplitude of up to 100 mT. Each tape within the stack carries the same dc current. The magnetic field amplitude, the frequency of the magnetic field, and the dc current magnitude are varied to investigate the influence of these parameters on the dynamic resistance. We find that the threshold field of the stack is significantly larger than that of a single tape when dc current is small, which we attribute to coherent shielding effects from circulating currents present in each wire in the stack. © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

History

Preferred citation

Jiang, Z., Zhou, W., Bumby, C. W., Staines, M., Li, Q., Badcock, R. A., Long, N. J. & Fang, J. (2018). Dynamic Resistance Measurement of a Four-Tape YBCO Stack in a Perpendicular Magnetic Field. IEEE Transactions on Applied Superconductivity, 28(4), 1-5. https://doi.org/10.1109/TASC.2017.2787178

Journal title

IEEE Transactions on Applied Superconductivity

Volume

28

Issue

4

Publication date

01/06/2018

Pagination

1-5

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication status

Published

Contribution type

Article

ISSN

1051-8223

eISSN

1558-2515

Article number

ARTN 8200305

Language

en