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Detecting Changes in Fully Polarimetric SAR Imagery With Statistical Information Theory

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journal contribution
posted on 24.03.2021, 22:45 by ADC Nascimento, Alejandro Frery, RJ Cintra
© 1980-2012 IEEE. Images obtained from coherent illumination processes are contaminated with speckle. A prominent example of such imagery systems is the polarimetric synthetic aperture radar (PolSAR). For such a remote sensing tool, the speckle interference pattern appears in the form of a positive-definite Hermitian matrix, which requires specialized models and makes change detection a hard task. The scaled complex Wishart distribution is a widely used model for PolSAR images. Such a distribution is defined by two parameters: the number of looks and the complex covariance matrix. The last parameter contains all the necessary information to characterize the backscattered data, and thus, identifying changes in a sequence of images can be formulated as a problem of verifying whether the complex covariance matrices differ at two or more takes. This paper proposes a comparison between a classical change detection method based on the likelihood ratio and three statistical methods that depend on information-theoretic measures: the Kullback-Leibler (KL) distance and two entropies. The performance of these four tests was quantified in terms of their sample test powers and sizes using simulated data. The tests are then applied to actual PolSAR data. The results provide evidence that tests based on entropies may outperform those based on the KL distance and likelihood ratio statistics.

History

Preferred citation

Nascimento, A. D. C., Frery, A. C. & Cintra, R. J. (2019). Detecting Changes in Fully Polarimetric SAR Imagery With Statistical Information Theory. IEEE Transactions on Geoscience and Remote Sensing, 57(3), 1380-1392. https://doi.org/10.1109/TGRS.2018.2866367

Journal title

IEEE Transactions on Geoscience and Remote Sensing

Volume

57

Issue

3

Publication date

01/03/2019

Pagination

1380-1392

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publication status

Published

ISSN

0196-2892

eISSN

1558-0644

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