An Alternate Scattering-type Parameter for Target Characterization and Classification

Bhattacharya, Avik; Verma, Abhinav; Dey, Subhadip; Frery, Alejandro

doi:10.25455/wgtn.25009544

An Alternate Scattering-type Parameter for Target Characterization and Classification

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posted on 2024-01-17, 01:40 authored by Avik Bhattacharya, Abhinav Verma, Subhadip Dey, Alejandro FreryAlejandro Frery

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Bhattacharya, A., Verma, A., Dey, S. & Frery, A. C. (2024). An Alternate Scattering-type Parameter for Target Characterization and Classification. IEEE Transactions on Geoscience and Remote Sensing, 1-1. https://doi.org/10.1109/tgrs.2024.3354050

Publisher DOI

https://doi.org/10.1109/tgrs.2024.3354050

Journal title

IEEE Transactions on Geoscience and Remote Sensing

Publication date

2024-01-01

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1-1

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Institute of Electrical and Electronics Engineers (IEEE)

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Published

ISSN

0196-2892

eISSN

1558-0644

An Alternate Scattering-type Parameter for Target Characterization and Classification

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